{"id":10000088,"date":"2023-11-08T14:24:25","date_gmt":"2023-11-08T13:24:25","guid":{"rendered":"https:\/\/www.fh-joanneum.at\/embedded-systems-engineering\/master\/?page_id=88"},"modified":"2024-07-04T15:18:10","modified_gmt":"2024-07-04T13:18:10","slug":"curriculum","status":"publish","type":"page","link":"https:\/\/www.fh-joanneum.at\/embedded-systems-engineering\/master\/en\/my-studies\/curriculum\/","title":{"rendered":"Curriculum"},"content":{"rendered":"
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Curriculum overview<\/h3>\n<\/div>\n\n <\/div>\n <\/div>\n <\/div>\n<\/div>\n\n\n\n
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Current Curriculum<\/h2>\n <\/div>\n
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\n 1. Semester<\/span>\n \n\n<\/svg> <\/h4>\n <\/a>\n \n \n
\n \n Analog Circuit Design |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862101<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Analog Circuit Design<\/h5>\n
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5.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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3.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Stochastic signal theory: RMS, mean value, autocorrelation, cross correlation, spectral power density
\nNoise in electronic circuits: noise types, noise sources, transistor noise, noise figure
\nCircuit analysis with noise estimation: transistor and OpAmp noise calculations
\nActive filter circuits: filter characteristics, Sallen-Key and multifeedback circuit, 4th order bandpass, NIC, Gyrator, gm-C filter, double-T
\nSwitched capacitor filter: charge balancing, amplifier, integrator, filter
\nADC\/DAC specifications: ADC noise, ENOB, gain and offset error, INL, DNL, SFDR
\nA\/D and D\/A converter: resistor-string, R-2R ladder, weighted current sources, charge redistribution, PWM, Delta-Sigma DAC, Flash, pipelined, SAR, Dual-Slope, Delta-Sigma ADC
\nBandgap references: base-emitter voltage temperature drift, bandgap ref. circuits
\nFrontend design: example design with amplifier, filter and ADC, SNR and ENOB calculation
\nComputer simulations of circuit noise
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\n \n Data Analysis |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862106<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Data Analysis<\/h5>\n
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5.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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3.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Summarizing, organizing, and presenting a set of data using descriptive statistics methods such as frequencies, visualization tools, and correlation and covariance matrix
\nDescribing and predicting outcomes in uncertain situations using probability theory and their limit theorems
\nDefinition and applications of random variables including limit theorems, distributions, and model and parameter estimations
\nUse of software for statistical analysis
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\n \n Design Tools and Laboratory Engineering |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862104<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Design Tools and Laboratory Engineering<\/h5>\n
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3.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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3.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Procedural programming and the required programming environment
\nUse of debugging techniques for analysis and troubleshooting in software systems
\nIntroduction to object-oriented programming concepts by designing and implementing classes using practical examples\nIntroduction to laboratory operation
\nDimensioning and building of transistor and operational amplifier circuits on prototype boards
\nUsing lab equipment: power supplies and decoupling ICs, signal generation, multimeters, LCR bridge, oscilloscopes
\nIterative, manual creation of UI-curves and Bode diagrams
\nSpice introduction to basic transistor and operational amplifier circuits
\nScientific data processing with numerical analysis tools and graphical presentation of results with respect to guidelines for reports
\nPCB design workflow: capturing a schematic, routing of a PCB layout and the automatic generation of manufacturing and assembly data
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\n \n Digital Circuit Design |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862102<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Digital Circuit Design<\/h5>\n
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5.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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3.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Advanced hardware description language syntax and synthesizable HDL programming
\nPractical circuit design and simulation (e.g., arithmetic circuits, finite state machine and interfaces such as SPI, I2C, I2S or UART)
\nVerification techniques for digital circuits (e.g. simulation, assertions)
\nWorkflow for programmable logic devices (FPGAs) and their differences to digital integrated circuit designs (ASICs)
\nSynthesis and static timing analysis
\nOn chip-bus systems (e.g.: Wishbone, AXI-4, APB, AHP)
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\n \n Electronic Packaging |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862103<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Electronic Packaging<\/h5>\n
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3.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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2.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Introduction: overview, interaction between electrical and thermal performance
\nSemiconductor manufacturing: backend processes, assembly and packaging of chips
\nAdvanced packaging: heterogeneous and multi-component packages, embedding and related concepts
\nHigh integration for PCBs: multi-layer PCB design, signal integrity, routing
\nActive and passive cooling concepts for electronic devices, heat sinks, heat pipes
\nChip packaging concepts: flip-chip, wire bonding and more, chip-to-package interactions and thermal considerations
\nAdvanced 3D PCB design with CAD Tools
\nAssigning fabrication and assembly test points for mass production, flying-probe devices and bed-of-nails test fixtures
\nOscilloscope probe test point design
\nImpedance-matched waveguides, differential lines and other copper structures, signal integrity in high-frequency applications
\nInterfaces for microwave signal measurement, signal conditioning
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\n \n Engineering Management 1 |\n Seminar\n (SE)\n | Coursecode:\n M240862108<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Intercultural Communication<\/h5>\n
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1.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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1.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Definition and differentiation of the term \u201cculture\u201d
\nDealing with one’s own cultural identity as a starting point for cultural differences, getting to know the own culture better in order to be able to recognize different cultural behaviours
\nCultural diversity \u2013 comparison between the culture of the group members
\nFundamentals of communication: theoretical models and practical examples
\nInterpersonal communication and communication theory in an intercultural context
\nIntroduction to group dynamics in an intercultural context
\nCommunicating effectively with multicultural groups of people in different situations
\nIntercultural communication and everyday study life
\nIntroduction to the study of electronic engineering and the associated rights and obligations as a basis for an intercultural exchange about personal expectations and views on the common everyday study life
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\n \n Engineering Management 1 |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862107<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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System Requirements Engineering<\/h5>\n
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3.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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2.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Introduction into product development basics (development process, project organization,\u2026)
\nDefinition systems engineering
\nV-Model
\nSystems engineering activities & work products
\nStructuring principles incl. level structure
\nRequirements engineering (development vs. danagement)
\nSystem design within product development – requirements engineering & system
\nArchitecture specification
\nModel based systems engineering (MBSE) \/ SysML
\nBasic requirements engineering and applied V-model in the semiconductor industry
\nRequirements management & Design-to-Test
\nConformity & compliance
\nIntegration incl. integration management & test planning within product development
\nRequirements management tools
\nMBSE \/ SysML modeling tools
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\n \n Software Design and Architectures |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862105<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Software Design and Architectures<\/h5>\n
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5.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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3.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Object-Oriented Programming: Reinforcement of object-oriented programming concepts, with a focus on practical applications using examples from data structures and algorithms. Examination of fundamental configuration management methodologies, including source code versioning, build automation, and test automation.
\nObject-Oriented Modeling: The fundamental principles of object-oriented modeling will be revisited, with a specific focus on Unified Modeling Language (UML) diagrams like package, class, object, sequence, state machine, and activity diagram.
\nObject-Oriented Design: The essential principles of class and package design will be explored through hands-on examples to emphasize their significance in creating effective software solutions.
\nAdditionally, a variety of design patterns will be delved into, with particular attention to their relevance and implementation in embedded systems.\n <\/div>\n\n <\/div>\n <\/button>\n <\/div>\n <\/div>\n <\/div>\n
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\n 2. Semester<\/span>\n \n\n<\/svg> <\/h4>\n <\/a>\n \n \n
\n \n Machine Learning and Optimization |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862202<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Machine Learning and Optimization<\/h5>\n
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6.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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3.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n General concepts, algorithms, and models in machine learning such as constrained and unconstrained optimization, cross-validation, and model overfitting and underfitting.
\nData preparation techniques such as handling missing values and outliers, transforming data, binning, and encoding categorical variables
\nSelection and application of appropriate machine learning models for clustering, classification, and regression
\nMetrics-dependent model evaluation and model deployment into existing systems or processes
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\n \n Radio Frequency Engineering |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862201<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Radio Frequency Engineering<\/h5>\n
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7.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Introduction: Electrodynamics, Maxwell\u2019s equations
\nTransmission line theory: telegraph equation, time-independent wave-equation, voltage- and current-waves on lossless transmission lines, characteristic impedance, wavelength, phase velocity, reflection coefficient, VSWR, matching, Smith chart, S-parameters microstrip lines, impedance matching networks
\nElectromagnetic waves: plane waves in vacuum, plane waves in linear media (skin effect, eddy current, proximity effect, displacement current), electromagnetic waves in wave guides
\nAntennas and antenna arrays: Hertz antenna (properties of the electromagnetic field, far-field), linear radiators, antenna arrays
\nRF Components: baluns, directional couplers, power divider, circulator, double balanced mixers
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Specialisation Embedded Systems Engineering:<\/h5>\n <\/div>\n \n
\n \n Computer Architectures and Programming |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862203<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Computer Architectures and Programming<\/h5>\n
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6.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Exploration of an example microarchitecture and its Instruction set
\nAssembly programming on the example microarchitecture and instruction emulation
\nMethods and concepts for improving the performance of microarchitectures (e.g. pipelining, multiprocessors, branch prediction, out-of-order execution, speculative execution, cache memories)
\nWorkflow for implementing a microarchitecture on programmable system-on-chip or programmable logic devices as well as embedded software development for such hardware architectures
\nBenchmarking of a state-of-the-art processor and its architectural features
\nOperating system specific hardware components and concepts (memory management, cache coherency, simultaneous multithreading)
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\n \n Digital Signal Processing |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862204<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Digital Signal Processing<\/h5>\n
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5.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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3.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Review of discrete-time signals and systems, including signal representation, discrete-time convolution, eigen-signals, the discrete-time Fourier transform (DTFT), and the z-transform
\nAnalysis of the sampling theorem for sampling and reconstructing signals
\nAnalysis of the relationships between the continuous-time Fourier transform (CTFT), the discrete-time Fourier transform (DTFT), the discrete Fourier transform (DFT) and the fast Fourier transform (FFT)
\nDesign of finite impulse response (FIR), infinite impulse response (IIR), and adaptive filters to attenuate, equalize and generate signals
\nDesign of multi-rate systems to implement sample rate conversion and polyphase filters
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\n \n Software Quality and Security |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862205<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Software Quality and Security<\/h5>\n
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6.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Software Inspection: This process includes examining source code to identify “Bad Smells”, applying software metrics for code quality assessment, and using static code analysis to detect potential bugs
\nSoftware testing: It encompasses unit tests, which target individual software components, and integration tests, which validate interactions between components to ensure seamless functionality
\nSecure coding: This includes programming techniques like encapsulation, input validation, output encoding, secure data representation, and robust error handling & logging
\nCryptography in practice: It focuses on cryptographic techniques to secure data at rest, protecting sensitive information from unauthorized access and ensuring data integrity
\nReverse engineering: This involves analysis of binaries to understand their structure and functionality which is commonly used in debugging and security research
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Specialisation Power Electronic Engineering:<\/h5>\n <\/div>\n \n
\n \n Digital Control Systems |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862209<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Digital Control Systems<\/h5>\n
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6.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Review of Control Systems: operation of analog and digital control systems, components, analog vs digital, transfer function, PID
\nIdentification of dynamic systems based on discrete time models
\nDesign and Implementation of Digital Controllers for SISO systems based on discrete transfer functions
\nDesign and Implementation of Digital Controllers for multivariable systems (MISO, MIMO) using state space representation
\nStability and robustness: design of control systems considering uncertainties of the plant\u2019s parameters and disturbances
\nApplication of control design for electrical and electromechanical systems
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\n \n Digital Signal Processing |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862204<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Digital Signal Processing<\/h5>\n
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5.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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3.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Review of discrete-time signals and systems, including signal representation, discrete-time convolution, eigen-signals, the discrete-time Fourier transform (DTFT), and the z-transform
\nAnalysis of the sampling theorem for sampling and reconstructing signals
\nAnalysis of the relationships between the continuous-time Fourier transform (CTFT), the discrete-time Fourier transform (DTFT), the discrete Fourier transform (DFT) and the fast Fourier transform (FFT)
\nDesign of finite impulse response (FIR), infinite impulse response (IIR), and adaptive filters to attenuate, equalize and generate signals
\nDesign of multi-rate systems to implement sample rate conversion and polyphase filters
\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n \n Power Electronic Components |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862211<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Power Electronic Components<\/h5>\n
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6.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Overview of basic topologies of DC-DC Conversion (buck, boost)
\nGate drivers for MOSFET half-bridges, switching analysis
\nDesign and implementation of input\/output filters
\nAnalysis of passive power components (capacitors, inductors, transformers)
\nStructure and operation of power semiconductors (diodes, Si-MOSFETs, SiC-MOSFETs, IGBTs, GaN-HEMTs)
\nAnalysis of sensors in power electronic circuits (temperature, speed, vibration, voltage, current)
\n3D modeling of power electronic components for thermal simulation
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Specialisation System Test Engineering:<\/h5>\n <\/div>\n \n
\n \n Software Quality and Security |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862205<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Software Quality and Security<\/h5>\n
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6.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Software Inspection: This process includes examining source code to identify “Bad Smells”, applying software metrics for code quality assessment, and using static code analysis to detect potential bugs
\nSoftware testing: It encompasses unit tests, which target individual software components, and integration tests, which validate interactions between components to ensure seamless functionality
\nSecure coding: This includes programming techniques like encapsulation, input validation, output encoding, secure data representation, and robust error handling & logging
\nCryptography in practice: It focuses on cryptographic techniques to secure data at rest, protecting sensitive information from unauthorized access and ensuring data integrity
\nReverse engineering: This involves analysis of binaries to understand their structure and functionality which is commonly used in debugging and security research
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\n \n Test Standards and Quality Management |\n Lecture\n (VO)\n | Coursecode:\n M240862207<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Test Standards and Quality Management<\/h5>\n
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3.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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2.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Quality standards such as IATF 16949, ISO 9000, ISO 9001
\nIssue and risk management
\nTraceability and product liability
\nToyota production system (continuous improvement, Kaizen, 5S, …)
\nTest quality (KPI\u2019s, Economics, error prevention, error handling)
\nReliability stress tests (e.g. HTOL, HAST, THB, TC)
\nStatistical test methods and the ISO 2859 standard
\nEMC: Introduction and overview, fundamentals and theory, Integrated circuits test methods
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\n \n Test and Measurement Automation |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862206<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Test and Measurement Automation<\/h5>\n
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8.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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5.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Introduction to test and measurement automation with focus on semiconductor industry: automated test equipment and virtual instrumentation software
\nMeasurement instruments: terminology, key specification parameters, interpretation of datasheets for power supplies, source measure units, digital multimeters, function generators, oscilloscopes
\nStandard interfaces of measurement\/testing systems
\nSelection of hardware and software based on test cases and their measurement requirements
\nDevelopment of communication between the system and the necessary device drivers and libraries
\nDesign and implementation of an automated test system for an example DUT including software, measurement and testing equipment as well as hardware (sensors, PCB)
\nDevelopment of a proper datalogging strategy to post-process raw data for analyzing measurement results
\nApply version control methodologies to developed measurements, results and reports
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\n 3. Semester<\/span>\n \n\n<\/svg> <\/h4>\n <\/a>\n \n \n
\n \n Engineering Management 2 |\n Seminar\n (SE)\n | Coursecode:\n M240862301<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Project Management<\/h5>\n
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3.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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2.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Project types and methodologies
\nProject phases, milestones and gates
\nProject plans
\nEffort estimation methodologies
\nCommunication plans and meeting structures
\nResource-based and skill-based planning
\nRisk management
\nFailure mode and effect Analysis
\nAgile project management
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\n \n Engineering Management 3 |\n Project Thesis\n (PA)\n | Coursecode:\n M240862302<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Electronic Engineering Project<\/h5>\n
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6.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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0.50<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Solving a specific technical task on the under supervision that corresponds to the level of education.
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Specialisation System Test Engineering:<\/h5>\n <\/div>\n \n
\n \n Automotive Testing |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862309<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Automotive Testing<\/h5>\n
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6.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Introduction to testing of automotive systems
\nComplete vehicle testing overview
\nCAN and LIN busE\/E test benchesFlexRay and Ethernet
\nSystem integration testing (FRS)
\nHV battery and testing
\nElectromagnetic compatibility (EMC)
\nEMC standards for road vehicles and integrated circuits
\nFunctional safety (IEC EN 61508, ISO 26262)
\nIntroduction to automated driving
\nADAS\/AD: system architecture, sensors and features, development process
\nVirtual description of the static environment
\nTest execution environments for verification and validation
\nIntroduction to scenario based verification and validation
\nDescription of the dynamic environment (\u201escenarios\u201c)
\nSafety argumentation
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\n \n Design for Test |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862307<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Design for Test<\/h5>\n
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3.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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2.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n JTAG: boundary scan architecture and description language, tap controller internals
\nTesting of digital circuits: test modes, parallel tests, scan test, built-in self-tests
\nModularization and testing
\nLifetime management: wafer test, backend test, test of product returns (field tests)
\nFault simulation: controllability, observability, accessibility of circuits
\nScan Design
\nAutomatic Test Pattern Generation
\nTest Compression
\nDelay test
\nIddq testing
\nLogic Built in self test
\nMemory testing
\nFault Diagnosis
\nAnalog and mixed signal testing (IEEE 1149.4)
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\n \n Production Testing |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862310<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Production Testing<\/h5>\n
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7.00<\/h5>\n ECTS<\/span>\n <\/div>\n
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5.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Processes in electronic production and chip fabrication
\nTest program development and debugging
\nRemote debugging and remote development
\nCompliance matrix
\nMethods for test time optimization
\nTest flow, test insertions
\nGuard band (test-limit management)
\nPAT (part average testing)
\nPCB with test adapter
\nTest equipment overview and architecture
\nBinning and Grading
\nData Logging
\nWafer test and package test
\nATE programming
\nTraceability
\nTrimming and fusing
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\n \n Validation Test Development |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862308<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
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Validation Test Development<\/h5>\n
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5.00<\/h5>\n ECTS<\/span>\n <\/div>\n
\n
3.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Validation and production test
\nPreparing a verification plan
\nAutomatic test vector generation (ATVG)
\nStructural, block and system test
\nAutomated test
\nCharacterization, comparison with data sheet, Corner Testing
\nRobustness validation
\n <\/div>\n\n <\/div>\n <\/button>\n
\n
Specialisation Embedded Systems Engineering:<\/h5>\n <\/div>\n \n
\n \n Continuous Delivery in Embedded Systems |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862305<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
\n
Continuous Delivery in Embedded Systems<\/h5>\n
\n
\n
6.00<\/h5>\n ECTS<\/span>\n <\/div>\n
\n
4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n IoT architectures: selection of architectural patterns with a focus on IoT systems, message-oriented architectures and microservices
\nArchitectural risk analysis: attack surface analysis, and performing threat modeling to assess potential security risks
\nSoftware development lifecycle: phases of software development and process models used to manage the software development process
\nContinuous integration pipeline: pre-commit stage (code inspection, test-driven development), commit stage (unit testing, security testing, static code analysis, artifact repository)
\nContinuous delivery pipeline: acceptance stage (deployment into the test environment, acceptance testing, penetration testing), production stage (release into production)
\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n \n Design Verification |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862304<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
\n
Design Verification<\/h5>\n
\n
\n
3.00<\/h5>\n ECTS<\/span>\n <\/div>\n
\n
2.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Introduction to functional verification
\nFunctional verification in electronic circuit development: system level, schematic and PCB
\nFunctional verification in the System-on-Chip (SoC) design flow
\nEnsure the correctness and reliability of a design
\nRequirements driven verification: requirement specification and verification plan, simulation, and creating testbenches
\nVerification methods like pseudo-random stimuli generation, coverage-driven verification, assertion-based verification, and self-checking mechanisms
\nRTL und gatelevel-simulation
\nHardware description language usage for verification
\nReporting the findings and addressing any identified issues
\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n \n Realtime Computing |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862306<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
\n
Realtime Computing<\/h5>\n
\n
\n
6.00<\/h5>\n ECTS<\/span>\n <\/div>\n
\n
4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Computer Architecture Review
\nHW \/ SW partitioning and synchronization of HW and SW tasks to avoid race conditions
\nMultitasking\/Multithreading and Scheduling, Interprocess Communication (Pipes, Queues, Shared Memories)
\nOperating Systems (Embedded Linux, Free RTOS)
\nUnix\/Linux Ecosystem
\nProgramming Toolchains
\nDebugging and Profiling
\nNetworking
\nHW Acceleration, custom circuits, and hardened communication interfaces in the FPGA
\nSW-HW Communication using Registers, Dualport-RAMs, FIFO-Queues and Direct Memory Access (DMA) as well as Scheduling in the FPGA device
\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n \n System-on-Chip Design |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862303<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
\n
System-on-Chip Design<\/h5>\n
\n
\n
6.00<\/h5>\n ECTS<\/span>\n <\/div>\n
\n
4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Fundamentals of a modern instruction set architecture (e.g. RISC-V, ARM, etc.).
\nDesign and simulation of custom bus peripherals
\nDevelopement of a top-level chip design with a processor core, custom bus peripherals as well as existing IP from libraries
\nInstantiation of the architecture on a programmable logic device (FPGA) and verification via execution of software applications
\nIntroduction to a chip design workflow and toolchain for application specific integrated circuits (ASICs)
\nImplementation of the top-level chip design for production
\n <\/div>\n\n <\/div>\n <\/button>\n
\n
Specialisation Power Electronic Engineering:<\/h5>\n <\/div>\n \n
\n \n Electric Mobility |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862314<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
\n
Electric Mobility<\/h5>\n
\n
\n
6.00<\/h5>\n ECTS<\/span>\n <\/div>\n
\n
4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Introduction to electric mobility: electric drivetrain, testing facilities, types, requirements
\nAC electrical machines: design and construction, operating behaviour
\nUniversal modeling of electrical machines, including the grid as a virtual motor
\nOptimized control techniques for multi-phase systems (e.g. field oriented control for electric drives)
\nAnalysis of test systems for electric mobility components
\nModel-based design of electric mobility systems (HIL, P-HIL)
\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n \n Power Converter Design |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862312<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
\n
Power Converter Design<\/h5>\n
\n
\n
6.00<\/h5>\n ECTS<\/span>\n <\/div>\n
\n
4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Design of non-isolated DC-DC Converters for higher density and efficiency (interleaved, multi-level)
\nSelection of power semiconductors according to design criteria
\nDesign of DC-AC converter focusing on motor or power grid interface applications
\nDesign of isolated DC-DC converters including resonant converters (flyback, full-bridge, dual active bridge, series resonant converter)
\nSimulation-based design of PWM control methods
\nAnalysis of control units in the field of power electronics
\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n \n Power Electronic Device Engineering |\n Lecture\/Practical\n (IL)\n | Coursecode:\n M240862313<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
\n
Power Electronic Device Engineering<\/h5>\n
\n
\n
6.00<\/h5>\n ECTS<\/span>\n <\/div>\n
\n
4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Low voltage directive
\nAnalysis of protective measures and personal safety
\nAnalysis of typical power electronic devices e.g. PV inverters
\nSimulation-based design of EMI filters including FEM electromagnetics
\nDesign of high current\/low inductive PCBs (regarding eddy current effects)
\nAnalysis of mechanical assembly
\nConcept and implementation of power electronic cooling systems
\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n \n Renewable Energy |\n Lecture\n (VO)\n | Coursecode:\n M240862311<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
\n
Renewable Energy<\/h5>\n
\n
\n
3.00<\/h5>\n ECTS<\/span>\n <\/div>\n
\n
2.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Transformation towards electrified systems: Overview and market situation
\nRenewable Energy Generation: Photovoltaic systems, wind energy, hydropower, fuel cells, e-fuels, associated power electronic devices
\nEnergy Storage Systems: Hydrogen cycle, battery storage, mechanical storage, associated power electronic devices
\nSmart Grids: Charging techniques, DC microgrids, operation, control, benefits
\n <\/div>\n\n <\/div>\n <\/button>\n <\/div>\n <\/div>\n <\/div>\n
\n
\n \n

\n 4. Semester<\/span>\n \n\n<\/svg> <\/h4>\n <\/a>\n \n \n
\n \n Engineering Management 4 |\n Seminar\n (SE)\n | Coursecode:\n M240862401<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
\n
Innovation Management<\/h5>\n
\n
\n
2.00<\/h5>\n ECTS<\/span>\n <\/div>\n
\n
2.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Introduction to innovation management: definition, concepts and scope
\nTypes of innovation: product innovation, process innovation, service innovation, business model innovation
\nInnovation process: idea generation, idea screening and selection, development and prototyping, testing and validation, implementation and commercialization
\nFostering of innovation culture: creating a culture of experimentation and risk-taking, encouraging diversity for enhanced creativity, leadership’s role
\nCollaboration and cooperation for innovation: interdisciplinary teams, effective communication
\nManaging innovation risks: identifying innovation-related risks, learning from failure, short-term and long-term innovation goals
\nInnovation leadership and strategy: developing and communicating an innovation strategy, leading change, aligning innovation efforts with organizational goals
\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n \n Engineering Management 4 |\n Seminar\n (SE)\n | Coursecode:\n M240862402<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
\n
Presentations and Meetings<\/h5>\n
\n
\n
1.00<\/h5>\n ECTS<\/span>\n <\/div>\n
\n
1.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Interpersonal communication and communication theory in intercultural context
\nPreparing and carrying out international meetings
\nPresentation preparation and presentation techniques
\nWeb meetings
\nEffective communication with multicultural groups of people in different situations
\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n \n Master's Thesis and Scientific Working |\n Modul\/Final Examination\n (FA)\n | Coursecode:\n M240862405<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
\n
Master's Exam<\/h5>\n
\n
\n
3.00<\/h5>\n ECTS<\/span>\n <\/div>\n
\n
0.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n The board examination is carried out in accordance with the requirements for final examinations of FH Master\u2018s degree programmes pursuant to FHStG as amended.
\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n \n Master's Thesis and Scientific Working |\n Master's Thesis\n (MA)\n | Coursecode:\n M240862404<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
\n
Master's Thesis<\/h5>\n
\n
\n
22.00<\/h5>\n ECTS<\/span>\n <\/div>\n
\n
0.50<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Solving an engineering problem from the field in an industrial or scientific environment
\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n \n Master's Thesis and Scientific Working |\n Seminar\n (SE)\n | Coursecode:\n M240862403<\/span>\n <\/div>\n Language of instruction\n English<\/small>\n
\n
Scientific Working<\/h5>\n
\n
\n
2.00<\/h5>\n ECTS<\/span>\n <\/div>\n
\n
1.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n Scientific methods and scientific community
\nLiterature search and quotation rules: how to write clearly and precisely structure and writing of scientific papers
\nWriting an abstract
\nWriting a scientific report in the form of a conference paper
\n <\/div>\n\n <\/div>\n <\/button>\n <\/div>\n <\/div>\n <\/div>\n \n
\n

Discontinued Curriculum<\/h2>\n <\/div>\n
\n
\n \n

\n 1. Semester<\/span>\n \n\n<\/svg> <\/h4>\n <\/a>\n \n \n
\n
\n Digital Electronics |\n Lecture\/Practical\n (IL)\n | Coursecode:\n 200862103<\/span>\n <\/div>\n
\n
Digital Electronics<\/h5>\n
\n
\n
6.00\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n \u2022 Fundamentals of hardware description languages \n\u2022 Combinatorics and sequential logic in HDL \n\u2022 Simulation and testing of circuits in HDL \n\u2022 Development of synthesizable HDL code \n\u2022 HDL synthesis tools for FPGAs \n\u2022 Programming of microcontroller interfaces \n\u2022 Communication between microcontroller and FPGA via RS-232, I\u00b2C and SPI\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n
\n Mathematical Methods in Test Engineering |\n Lecture\/Practical\n (IL)\n | Coursecode:\n 200862101<\/span>\n <\/div>\n
\n
Mathematical Methods in Test Engineering<\/h5>\n
\n
\n
6.00\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n \u2022 Frequency distributions and visualizing data \n\u2022 Describing data by central tendency and variability \n\u2022 Probability and the normal distribution \n\u2022 Sampling distributions \n\u2022 Estimation and hypothesis testing \n\u2022 Correlation and linear regression \n\u2022 T-tests, chi-squared tests and analysis of variance (ANOVA) \n\u2022 Case studies of domain specific examples (e.g. test coverage, fault simulation)\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n
\n Mixed-Signal Electronics |\n Lecture\/Practical\n (IL)\n | Coursecode:\n 200862104<\/span>\n <\/div>\n
\n
Mixed-Signal Electronics<\/h5>\n
\n
\n
6.00\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n \u2022 Overview of sensor types and applications (e.g., inductive sensors, capacitive sensors, RADAR,   LIDAR, nbsp;nbsp;ultrasonic sensors, acceleration sensors, strain sensors, flow sensors,   magnetometers, hall nbsp;nbsp;sensors, temperature sensors) \n\u2022 Interfaces and measuring circuits for sensors \n\u2022 Signal processing from the sensor to the digital signal \n\u2022 Analog-to-digital converters \n\u2022 Synchronization of systems \n\u2022 Analog and digital filters \n\u2022 Applications and best practice for measurement equipment\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n
\n Software Environments and Programming |\n Lecture\/Practical\n (IL)\n | Coursecode:\n 200862102<\/span>\n <\/div>\n
\n
Software Environments and Programming<\/h5>\n
\n
\n
6.00\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n \u2022 Object-oriented software development in Python \n\u2022 Python standard libraries and test-specific libraries \n\u2022 Interfaces of measurement\/testing systems (TCP-IP, UDP, GPIB, RS-232\/422, USB) \n\u2022 Communication between the system and the necessary device drivers and libraries \n\u2022 Selection of data format and\/or database for archiving of results \n\u2022 Version management\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n
\n System Requirements and Testing |\n Lecture\/Practical\n (IL)\n | Coursecode:\n 200862105<\/span>\n <\/div>\n
\n
System Requirements and Testing<\/h5>\n
\n
\n
6.00\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n \u2022 Fundamentals of mechatronic systems \n\u2022 Structural vs. application testing \n\u2022 V-model for mechatronic systems \n\u2022 Requirements management and testing \n\u2022 System test strategies (test planning, test methods, test cases) \n\u2022 Compliance matrix \n\u2022 Model-based development \n\u2022 Functional testing \n\u2022 Hardware-in-the-loop \n\u2022 Software-in-the-loop \n\u2022 Model-in-the-loop \n\u2022 Testing of system and component specifications\n <\/div>\n\n <\/div>\n <\/button>\n <\/div>\n <\/div>\n <\/div>\n
\n
\n \n

\n 2. Semester<\/span>\n \n\n<\/svg> <\/h4>\n <\/a>\n \n \n
\n
\n Data Mining and Processing |\n Lecture\/Practical\n (IL)\n | Coursecode:\n 200862201<\/span>\n <\/div>\n
\n
Data Mining and Processing<\/h5>\n
\n
\n
6.00\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n \u2022 Signal processing for data processing (filtering, spectral analysis, \u00a0;\u00a0;interpolation, decimation) \n\u2022 Methods and data structures for time series analysis \n\u2022 Data visualization and reporting, anomaly detection, dependency System Test \u00a0;\u00a0;modelling,\u00a0clustering, classification and regression \n\u2022 Event detection \n\u2022 Data visualization and reporting\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n
\n PCB Design for Testing |\n Lecture\/Practical\n (IL)\n | Coursecode:\n 200862204<\/span>\n <\/div>\n
\n
PCB Design for Testing<\/h5>\n
\n
\n
3.00\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
2.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n \u2022 EMC-aware PCB design \n\u2022 Shielding and guarding \n\u2022 Crosstalk and parasitic effects \n\u2022 Controlled impedance routing \n\u2022 Power integrity \n\u2022 Impedance adjustment \n\u2022 Test structures for PCB design \n\u2022 Contacting (test socket, needle cards, plug connections) \n\u2022 Assembly and component selection \u2022 Analysis of good and bad examples of PCB layout\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n
\n Quality and Reliability Testing |\n Lecture\n (VO)\n | Coursecode:\n 200862205<\/span>\n <\/div>\n
\n
Quality and Reliability Testing<\/h5>\n
\n
\n
3.00\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
2.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n \u2022 Quality and reliability: definition, assessment, indicators and planning \n\u2022 System and component qualification \n\u2022 ESD and latch up effect \n\u2022 EMC control \n\u2022 High and low temperature operating limits (HTOL\/LTOL), \n\u2022 Highly accelerated stress test (HAST) \n\u2022 High temperature storage life (HTSL) \n\u2022 Temperature humidity bias (THB)\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n
\n Software Testing |\n Lecture\/Practical\n (IL)\n | Coursecode:\n 200862202<\/span>\n <\/div>\n
\n
Software Testing<\/h5>\n
\n
\n
6.00\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n \u2022 Software development lifecycle \n\u2022 Fundamental concepts in software testing \n\u2022 Testing throughout the software lifecycle \n\u2022 Static and dynamic testing strategies \n\u2022 Test design and management \n\u2022 Testing strategies for software \n\u2022 Regression test, module test and integration test \n\u2022 Tools support for testing \n\u2022 Firmware testing \n\u2022 Versioning and documentation\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n
\n Test Standards |\n Lecture\n (VO)\n | Coursecode:\n 200862206<\/span>\n <\/div>\n
\n
Test Standards<\/h5>\n
\n
\n
6.00\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n \u2022 Verifying designs and testing printed circuit boards according to the JTAG standard \n\u2022 Functional safety according to ISO 26262 \n\u2022 Quality standards such as IATF 16949 \n\u2022 Overview of EMC standards \n\u2022 Statistical test methods and the ISO 2859 standard\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n
\n Test and Measurement Automation Laboratory |\n Lecture\/Practical\n (IL)\n | Coursecode:\n 200862203<\/span>\n <\/div>\n
\n
Test and Measurement Automation Laboratory<\/h5>\n
\n
\n
6.00\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n \u2022 Building automated test systems based on a complex example including software,   measurement\/testing equipment and hardware (sensors, PCB) \n\u2022 Selection of hardware and software based on test cases and their measurement   requirements \n\u2022 Implementation and automation of test systems \n\u2022 Test documentation and version control \n\u2022 Measurement system analysis (MSA)\n <\/div>\n\n <\/div>\n <\/button>\n <\/div>\n <\/div>\n <\/div>\n
\n
\n \n

\n 3. Semester<\/span>\n \n\n<\/svg> <\/h4>\n <\/a>\n \n \n
\n
\n Project |\n Project Thesis\n (PA)\n | Coursecode:\n 200862304<\/span>\n <\/div>\n
\n
Project<\/h5>\n
\n
\n
9.00\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
1.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n Solving a technical task on the subject of testing under supervision that corresponds to the level of education.\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n
\n Project Management |\n Seminar\n (SE)\n | Coursecode:\n 200862302<\/span>\n <\/div>\n
\n
Project Management<\/h5>\n
\n
\n
3.00\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
2.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n \u2022 Project plan \n\u2022 Time and resource planning \n\u2022 Roles (developer, tester) \n\u2022 Project phases, milestones, gates and critical path \n\u2022 Interaction with quality management \n\u2022 Failure management \n\u2022 Implementation in case studies \n\u2022 Risk analysis using the Failure Mode and Effects Analysis method (FMEA) \n\u2022 Final project review (lessons learned)\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n
\n Security and Testing |\n Lecture\/Practical\n (IL)\n | Coursecode:\n 200862301<\/span>\n <\/div>\n
\n
Security and Testing<\/h5>\n
\n
\n
3.00\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
2.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n \u2022 Fundamentals of information security \n\u2022 Software methods for information security (e.g. encryption, certificates) \n\u2022 Hardware methods for information security (e.g. side-channel attacks and   countermeasures) \n\u2022 Examples of successful security attacks and possible solutions\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n
\n Technical Documentation |\n Seminar\n (SE)\n | Coursecode:\n 200862303<\/span>\n <\/div>\n
\n
Technical Documentation<\/h5>\n
\n
\n
3.00\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
2.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n \u2022 Terminology in engineering and information technology \n\u2022 Target group oriented writing \n\u2022 Readability and comprehensibility \n\u2022 Design, typography, layout, information graphics, technical illustration \n\u2022 Test specification, failure tracking and customer-specific reports \n\u2022 Standardisation of format and language through the use of templates and \u00a0;\u00a0;standards\n <\/div>\n\n <\/div>\n <\/button>\n
\n
Specialisation Semiconductor Testing:<\/h5>\n <\/div>\n \n
\n
\n Semiconductor Testing |\n Lecture\/Practical\n (IL)\n | Coursecode:\n 200862305<\/span>\n <\/div>\n
\n
Design for Test<\/h5>\n
\n
\n
3.00\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
2.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n \u2022 Definition of terms \n\u2022 Testing of semiconductors (application example) \n\u2022 Controllability, observability, accessibility of circuits \n\u2022 Modularization and testing \n\u2022 Test modes\n\u2022 Parallel tests \n\u2022 Life time management: wafer test, backend test, test of product returns (field   tests) \n\u2022 Structural testing nbsp;nbsp;(White Box, Grey Box, Black Box) \n\u2022 Application\/functional testing \n\u2022 Testing of digital circuits (scan test, JTAG, built-in self-tests) \n\u2022 Testing mixed-signal circuits (built-in self-tests, IEEE 1149.4)\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n
\n Semiconductor Testing |\n Lecture\/Practical\n (IL)\n | Coursecode:\n 200862307<\/span>\n <\/div>\n
\n
Production Testing<\/h5>\n
\n
\n
4.50\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n \u2022 Processes in electronic production and chip fabrication \n\u2022 Test program development and debugging \n\u2022 Remote debugging and remote development \n\u2022 Compliance matrix \n\u2022 Methods for test time optimization \n\u2022 Test flow, test insertions \n\u2022 Guard band (test-limit management) \n\u2022 PAT (part average testing) \n\u2022 PCB with test adapter \n\u2022 Test equipment overview and architecture \n\u2022 Binning and Grading \n\u2022 Data Logging \n\u2022 Wafer test and package test \n\u2022 ATE programming \n\u2022 Traceability \n\u2022 Trimming and fusing\n <\/div>\n\n <\/div>\n <\/button>\n \n
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\n Semiconductor Testing |\n Lecture\/Practical\n (IL)\n | Coursecode:\n 200862306<\/span>\n <\/div>\n
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Verification and Validation Testing<\/h5>\n
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4.50\n <\/h5>\n ECTS<\/span>\n <\/div>\n
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4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n \u2022 Validation and production test \n\u2022 Preparing a verification plan \n\u2022 Automatic test vector generation (ATVG) \n\u2022 Structural, block and system test \n\u2022 Automated test \n\u2022 Characterization, comparison with data sheet, Corner Testing \n\u2022 Robustness validation\n <\/div>\n\n <\/div>\n <\/button>\n
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Specialisation System Testing:<\/h5>\n <\/div>\n \n
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\n System Testing |\n Lecture\/Practical\n (IL)\n | Coursecode:\n 200862308<\/span>\n <\/div>\n
\n
Machine Learning and Optimization for Testing<\/h5>\n
\n
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3.00\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
2.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n \u2022 Optimization algorithms (heuristic methods, interactive methods) \n\u2022 Machine learning (supervised and unsupervised) \n\u2022 Annotation of data, detection rate and overfitting \n\u2022 Types of neural networks \n\u2022 Learning of neural networks \n\u2022 Verifying the performance of neural networks using test data \n\u2022 Improving the performance of neural networks\n <\/div>\n\n <\/div>\n <\/button>\n \n
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\n System Testing |\n Lecture\/Practical\n (IL)\n | Coursecode:\n 200862310<\/span>\n <\/div>\n
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Testing of Automotive Systems<\/h5>\n
\n
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4.50\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n \u2022 Test platforms in the automotive industry (lab vehicle, subsystems, overall   vehicle tests) \n\u2022 Electrical safety (HV tests on systems and the overall vehicle) \n\u2022 ESD and EMC testing \n\u2022 Sensor stimulation or sensor simulation for the VIL \n\u2022 Case example from the automotive industry \n\u2022 Levels of automated driving according to SAE \n\u2022 Advanced driver assistance systems (ADAS) and autonomous driving (AD) \n\u2022 Scenario-based validation of ADAS\/AD\n <\/div>\n\n <\/div>\n <\/button>\n \n
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\n System Testing |\n Lecture\/Practical\n (IL)\n | Coursecode:\n 200862309<\/span>\n <\/div>\n
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Testing of Mechatronic Systems<\/h5>\n
\n
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4.50\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
4.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n \u2022 Introduction to mechatronic systems of different complexity \n\u2022 Functional relationship between the overall system and the subsystems involved \n\u2022 Validation environments for mechatronic systems (MIL, SIL, HIL, test bench) \n\u2022 Development and validation of models of subsystems \n\u2022 Correlation between real-world tests and model-based tests \n\u2022 Efficient allocation of the necessary validation tests to different test   environments \n\u2022 Methods for estimating test coverage\n <\/div>\n\n <\/div>\n <\/button>\n <\/div>\n <\/div>\n <\/div>\n
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\n \n

\n 4. Semester<\/span>\n \n\n<\/svg> <\/h4>\n <\/a>\n \n \n
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\n Intercultural Communication and Meetings |\n Seminar\n (SE)\n | Coursecode:\n 200862401<\/span>\n <\/div>\n
\n
Intercultural Communication and Meetings<\/h5>\n
\n
\n
3.00\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
2.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n \u2022 Interpersonal communication and communication theory in intercultural context \n\u2022 Preparing and carrying out international meetings \n\u2022 Presentation preparation and presentation techniques \n\u2022 Web meetings \n\u2022 Effective communication with multicultural groups of people in different situations\n <\/div>\n\n <\/div>\n <\/button>\n \n
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\n Scientific Working |\n Master's Thesis\n (MA)\n | Coursecode:\n 200862403<\/span>\n <\/div>\n
\n
Master's Thesis<\/h5>\n
\n
\n
24.00\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
1.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n Solving a subject-specific engineering problem from the industrial environment The board examination is carried out in accordance with the requirements for final examinations of FH Master\u2018s degree programmes pursuant to FHStG as amended.\n <\/div>\n\n <\/div>\n <\/button>\n \n
\n
\n Scientific Working |\n Seminar\n (SE)\n | Coursecode:\n 200862402<\/span>\n <\/div>\n
\n
Scientific Writing<\/h5>\n
\n
\n
3.00\n <\/h5>\n ECTS<\/span>\n <\/div>\n
\n
1.00<\/h5>\n SWS<\/span>\n <\/div>\n <\/div>\n <\/div>\n\n \n\n \u2022 Scientific methods and scientific community \n\u2022 Literature search and quotation rules \n\u2022 Structuring and writing scientific papers\n\u2022 Planning of the necessary work steps as well as time and resource planning\n\u2022 Scientific elaboration of a subject-specific task \n\u2022 Presentation of interim and final result(s) \n\u2022 Writing a scientific report in the form of a conference paper\n <\/div>\n\n <\/div>\n <\/button>\n <\/div>\n <\/div>\n <\/div>\n <\/div>\n <\/div>\n<\/div>\n\n\n\n\n\n
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\n \n
\n \n\n \n<\/svg>
\n \n Flyer with Curriculum\n <\/span>\n\n
\n 153 KB<\/span>\n PDF<\/span>\n <\/div>\n <\/div>\n <\/div>\n <\/a>\n <\/div>\n <\/div>\n <\/div>\n<\/div>\n\n\n
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\n
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\n

Course Content<\/h3>\n<\/div>\n\n <\/div>\n <\/div>\n <\/div>\n<\/div>\n\n\n\n
\n
\n
\n \n
\n \n\n \n<\/svg>
\n \n 1st Semester\n <\/span>\n\n
\n 219 KB<\/span>\n PDF<\/span>\n <\/div>\n <\/div>\n <\/div>\n <\/a>\n <\/div>\n
\n \n
\n \n\n \n<\/svg>
\n \n 2nd Semester\n <\/span>\n\n
\n 179 KB<\/span>\n PDF<\/span>\n <\/div>\n <\/div>\n <\/div>\n <\/a>\n <\/div>\n
\n \n
\n \n\n \n<\/svg>
\n \n 3rd Semester\n <\/span>\n\n
\n 181 KB<\/span>\n PDF<\/span>\n <\/div>\n <\/div>\n <\/div>\n <\/a>\n <\/div>\n
\n \n
\n \n\n \n<\/svg>
\n \n 4h Semester\n <\/span>\n\n
\n 158 KB<\/span>\n PDF<\/span>\n <\/div>\n <\/div>\n <\/div>\n <\/a>\n <\/div>\n <\/div>\n <\/div>\n<\/div>\n","protected":false},"excerpt":{"rendered":"

To make your education as wide-ranging and practice-oriented as possible, the course content is divided into modules of different subject areas. Here you can find an overview of all modules and the associated courses.<\/p>\n","protected":false},"author":11,"featured_media":0,"parent":10000086,"menu_order":22,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"footnotes":""},"acf":[],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/www.fh-joanneum.at\/embedded-systems-engineering\/master\/en\/wp-json\/wp\/v2\/pages\/10000088"}],"collection":[{"href":"https:\/\/www.fh-joanneum.at\/embedded-systems-engineering\/master\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.fh-joanneum.at\/embedded-systems-engineering\/master\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.fh-joanneum.at\/embedded-systems-engineering\/master\/en\/wp-json\/wp\/v2\/users\/11"}],"replies":[{"embeddable":true,"href":"https:\/\/www.fh-joanneum.at\/embedded-systems-engineering\/master\/en\/wp-json\/wp\/v2\/comments?post=10000088"}],"version-history":[{"count":1,"href":"https:\/\/www.fh-joanneum.at\/embedded-systems-engineering\/master\/en\/wp-json\/wp\/v2\/pages\/10000088\/revisions"}],"predecessor-version":[{"id":10000170,"href":"https:\/\/www.fh-joanneum.at\/embedded-systems-engineering\/master\/en\/wp-json\/wp\/v2\/pages\/10000088\/revisions\/10000170"}],"up":[{"embeddable":true,"href":"https:\/\/www.fh-joanneum.at\/embedded-systems-engineering\/master\/en\/wp-json\/wp\/v2\/pages\/10000086"}],"wp:attachment":[{"href":"https:\/\/www.fh-joanneum.at\/embedded-systems-engineering\/master\/en\/wp-json\/wp\/v2\/media?parent=10000088"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}