Department of Engineering
System Test Engineering
My Studies
Current Curriculum
1. Semester
Digital Electronics | Lecture/Practical (IL) | Coursecode: 200862103
Digital Electronics
4 SWS
6 ECTS
• Fundamentals of hardware description languages
• Combinatorics and sequential logic in HDL
• Simulation and testing of circuits in HDL
• Development of synthesizable HDL code
• HDL synthesis tools for FPGAs
• Programming of microcontroller interfaces
• Communication between microcontroller and FPGA via RS-232, I²C and SPI
• Combinatorics and sequential logic in HDL
• Simulation and testing of circuits in HDL
• Development of synthesizable HDL code
• HDL synthesis tools for FPGAs
• Programming of microcontroller interfaces
• Communication between microcontroller and FPGA via RS-232, I²C and SPI
Mathematical Methods in Test Engineering | Lecture/Practical (IL) | Coursecode: 200862101
Mathematical Methods in Test Engineering
4 SWS
6 ECTS
• Frequency distributions and visualizing data
• Describing data by central tendency and variability
• Probability and the normal distribution
• Sampling distributions
• Estimation and hypothesis testing
• Correlation and linear regression
• T-tests, chi-squared tests and analysis of variance (ANOVA)
• Case studies of domain specific examples (e.g. test coverage, fault simulation)
• Describing data by central tendency and variability
• Probability and the normal distribution
• Sampling distributions
• Estimation and hypothesis testing
• Correlation and linear regression
• T-tests, chi-squared tests and analysis of variance (ANOVA)
• Case studies of domain specific examples (e.g. test coverage, fault simulation)
Mixed-Signal Electronics | Lecture/Practical (IL) | Coursecode: 200862104
Mixed-Signal Electronics
4 SWS
6 ECTS
• Overview of sensor types and applications (e.g., inductive sensors, capacitive sensors, RADAR, LIDAR, nbsp;nbsp;ultrasonic sensors, acceleration sensors, strain sensors, flow sensors, magnetometers, hall nbsp;nbsp;sensors, temperature sensors)
• Interfaces and measuring circuits for sensors
• Signal processing from the sensor to the digital signal
• Analog-to-digital converters
• Synchronization of systems
• Analog and digital filters
• Applications and best practice for measurement equipment
• Interfaces and measuring circuits for sensors
• Signal processing from the sensor to the digital signal
• Analog-to-digital converters
• Synchronization of systems
• Analog and digital filters
• Applications and best practice for measurement equipment
Software Environments and Programming | Lecture/Practical (IL) | Coursecode: 200862102
Software Environments and Programming
4 SWS
6 ECTS
• Object-oriented software development in Python
• Python standard libraries and test-specific libraries
• Interfaces of measurement/testing systems (TCP-IP, UDP, GPIB, RS-232/422, USB)
• Communication between the system and the necessary device drivers and libraries
• Selection of data format and/or database for archiving of results
• Version management
• Python standard libraries and test-specific libraries
• Interfaces of measurement/testing systems (TCP-IP, UDP, GPIB, RS-232/422, USB)
• Communication between the system and the necessary device drivers and libraries
• Selection of data format and/or database for archiving of results
• Version management
System Requirements and Testing | Lecture/Practical (IL) | Coursecode: 200862105
System Requirements and Testing
4 SWS
6 ECTS
• Fundamentals of mechatronic systems
• Structural vs. application testing
• V-model for mechatronic systems
• Requirements management and testing
• System test strategies (test planning, test methods, test cases)
• Compliance matrix
• Model-based development
• Functional testing
• Hardware-in-the-loop
• Software-in-the-loop
• Model-in-the-loop
• Testing of system and component specifications
• Structural vs. application testing
• V-model for mechatronic systems
• Requirements management and testing
• System test strategies (test planning, test methods, test cases)
• Compliance matrix
• Model-based development
• Functional testing
• Hardware-in-the-loop
• Software-in-the-loop
• Model-in-the-loop
• Testing of system and component specifications
2. Semester
Data Mining and Processing | Lecture/Practical (IL) | Coursecode: 200862201
Data Mining and Processing
4 SWS
6 ECTS
• Signal processing for data processing (filtering, spectral analysis, ; ;interpolation, decimation)
• Methods and data structures for time series analysis
• Data visualization and reporting, anomaly detection, dependency System Test ; ;modelling, clustering, classification and regression
• Event detection
• Data visualization and reporting
• Methods and data structures for time series analysis
• Data visualization and reporting, anomaly detection, dependency System Test ; ;modelling, clustering, classification and regression
• Event detection
• Data visualization and reporting
PCB Design for Testing | Lecture/Practical (IL) | Coursecode: 200862204
PCB Design for Testing
2 SWS
3 ECTS
• EMC-aware PCB design
• Shielding and guarding
• Crosstalk and parasitic effects
• Controlled impedance routing
• Power integrity
• Impedance adjustment
• Test structures for PCB design
• Contacting (test socket, needle cards, plug connections)
• Assembly and component selection • Analysis of good and bad examples of PCB layout
• Shielding and guarding
• Crosstalk and parasitic effects
• Controlled impedance routing
• Power integrity
• Impedance adjustment
• Test structures for PCB design
• Contacting (test socket, needle cards, plug connections)
• Assembly and component selection • Analysis of good and bad examples of PCB layout
Quality and Reliability Testing | Lecture (VO) | Coursecode: 200862205
Quality and Reliability Testing
2 SWS
3 ECTS
• Quality and reliability: definition, assessment, indicators and planning
• System and component qualification
• ESD and latch up effect
• EMC control
• High and low temperature operating limits (HTOL/LTOL),
• Highly accelerated stress test (HAST)
• High temperature storage life (HTSL)
• Temperature humidity bias (THB)
• System and component qualification
• ESD and latch up effect
• EMC control
• High and low temperature operating limits (HTOL/LTOL),
• Highly accelerated stress test (HAST)
• High temperature storage life (HTSL)
• Temperature humidity bias (THB)
Software Testing | Lecture/Practical (IL) | Coursecode: 200862202
Software Testing
4 SWS
6 ECTS
• Software development lifecycle
• Fundamental concepts in software testing
• Testing throughout the software lifecycle
• Static and dynamic testing strategies
• Test design and management
• Testing strategies for software
• Regression test, module test and integration test
• Tools support for testing
• Firmware testing
• Versioning and documentation
• Fundamental concepts in software testing
• Testing throughout the software lifecycle
• Static and dynamic testing strategies
• Test design and management
• Testing strategies for software
• Regression test, module test and integration test
• Tools support for testing
• Firmware testing
• Versioning and documentation
Test and Measurement Automation Laboratory | Lecture/Practical (IL) | Coursecode: 200862203
Test and Measurement Automation Laboratory
4 SWS
6 ECTS
• Building automated test systems based on a complex example including software, measurement/testing equipment and hardware (sensors, PCB)
• Selection of hardware and software based on test cases and their measurement requirements
• Implementation and automation of test systems
• Test documentation and version control
• Measurement system analysis (MSA)
• Selection of hardware and software based on test cases and their measurement requirements
• Implementation and automation of test systems
• Test documentation and version control
• Measurement system analysis (MSA)
Test Standards | Lecture (VO) | Coursecode: 200862206
Test Standards
4 SWS
6 ECTS
• Verifying designs and testing printed circuit boards according to the JTAG standard
• Functional safety according to ISO 26262
• Quality standards such as IATF 16949
• Overview of EMC standards
• Statistical test methods and the ISO 2859 standard
• Functional safety according to ISO 26262
• Quality standards such as IATF 16949
• Overview of EMC standards
• Statistical test methods and the ISO 2859 standard
3. Semester
Project | Project Thesis (PA) | Coursecode: 200862304
Project
1 SWS
9 ECTS
Solving a technical task on the subject of testing under supervision that corresponds to the level of education.
Project Management | Seminar (SE) | Coursecode: 200862302
Project Management
2 SWS
3 ECTS
• Project plan
• Time and resource planning
• Roles (developer, tester)
• Project phases, milestones, gates and critical path
• Interaction with quality management
• Failure management
• Implementation in case studies
• Risk analysis using the Failure Mode and Effects Analysis method (FMEA)
• Final project review (lessons learned)
• Time and resource planning
• Roles (developer, tester)
• Project phases, milestones, gates and critical path
• Interaction with quality management
• Failure management
• Implementation in case studies
• Risk analysis using the Failure Mode and Effects Analysis method (FMEA)
• Final project review (lessons learned)
Security and Testing | Lecture/Practical (IL) | Coursecode: 200862301
Security and Testing
2 SWS
3 ECTS
• Fundamentals of information security
• Software methods for information security (e.g. encryption, certificates)
• Hardware methods for information security (e.g. side-channel attacks and countermeasures)
• Examples of successful security attacks and possible solutions
• Software methods for information security (e.g. encryption, certificates)
• Hardware methods for information security (e.g. side-channel attacks and countermeasures)
• Examples of successful security attacks and possible solutions
Technical Documentation | Seminar (SE) | Coursecode: 200862303
Technical Documentation
2 SWS
3 ECTS
• Terminology in engineering and information technology
• Target group oriented writing
• Readability and comprehensibility
• Design, typography, layout, information graphics, technical illustration
• Test specification, failure tracking and customer-specific reports
• Standardisation of format and language through the use of templates and ; ;standards
• Target group oriented writing
• Readability and comprehensibility
• Design, typography, layout, information graphics, technical illustration
• Test specification, failure tracking and customer-specific reports
• Standardisation of format and language through the use of templates and ; ;standards
Field Semiconductor Testing:
Semiconductor Testing | Lecture/Practical (IL) | Coursecode: 200862305
Design for Test
2 SWS
3 ECTS
• Definition of terms
• Testing of semiconductors (application example)
• Controllability, observability, accessibility of circuits
• Modularization and testing
• Test modes
• Parallel tests
• Life time management: wafer test, backend test, test of product returns (field tests)
• Structural testing nbsp;nbsp;(White Box, Grey Box, Black Box)
• Application/functional testing
• Testing of digital circuits (scan test, JTAG, built-in self-tests)
• Testing mixed-signal circuits (built-in self-tests, IEEE 1149.4)
• Testing of semiconductors (application example)
• Controllability, observability, accessibility of circuits
• Modularization and testing
• Test modes
• Parallel tests
• Life time management: wafer test, backend test, test of product returns (field tests)
• Structural testing nbsp;nbsp;(White Box, Grey Box, Black Box)
• Application/functional testing
• Testing of digital circuits (scan test, JTAG, built-in self-tests)
• Testing mixed-signal circuits (built-in self-tests, IEEE 1149.4)
Semiconductor Testing | Lecture/Practical (IL) | Coursecode: 200862307
Production Testing
4 SWS
4.5 ECTS
• Processes in electronic production and chip fabrication
• Test program development and debugging
• Remote debugging and remote development
• Compliance matrix
• Methods for test time optimization
• Test flow, test insertions
• Guard band (test-limit management)
• PAT (part average testing)
• PCB with test adapter
• Test equipment overview and architecture
• Binning and Grading
• Data Logging
• Wafer test and package test
• ATE programming
• Traceability
• Trimming and fusing
• Test program development and debugging
• Remote debugging and remote development
• Compliance matrix
• Methods for test time optimization
• Test flow, test insertions
• Guard band (test-limit management)
• PAT (part average testing)
• PCB with test adapter
• Test equipment overview and architecture
• Binning and Grading
• Data Logging
• Wafer test and package test
• ATE programming
• Traceability
• Trimming and fusing
Semiconductor Testing | Lecture/Practical (IL) | Coursecode: 200862306
Verification and Validation Testing
4 SWS
4.5 ECTS
• Validation and production test
• Preparing a verification plan
• Automatic test vector generation (ATVG)
• Structural, block and system test
• Automated test
• Characterization, comparison with data sheet, Corner Testing
• Robustness validation
• Preparing a verification plan
• Automatic test vector generation (ATVG)
• Structural, block and system test
• Automated test
• Characterization, comparison with data sheet, Corner Testing
• Robustness validation
Field System Testing:
System Testing | Lecture/Practical (IL) | Coursecode: 200862308
Machine Learning and Optimization for Testing
2 SWS
3 ECTS
• Optimization algorithms (heuristic methods, interactive methods)
• Machine learning (supervised and unsupervised)
• Annotation of data, detection rate and overfitting
• Types of neural networks
• Learning of neural networks
• Verifying the performance of neural networks using test data
• Improving the performance of neural networks
• Machine learning (supervised and unsupervised)
• Annotation of data, detection rate and overfitting
• Types of neural networks
• Learning of neural networks
• Verifying the performance of neural networks using test data
• Improving the performance of neural networks
System Testing | Lecture/Practical (IL) | Coursecode: 200862310
Testing of Automotive Systems
4 SWS
4.5 ECTS
• Test platforms in the automotive industry (lab vehicle, subsystems, overall vehicle tests)
• Electrical safety (HV tests on systems and the overall vehicle)
• ESD and EMC testing
• Sensor stimulation or sensor simulation for the VIL
• Case example from the automotive industry
• Levels of automated driving according to SAE
• Advanced driver assistance systems (ADAS) and autonomous driving (AD)
• Scenario-based validation of ADAS/AD
• Electrical safety (HV tests on systems and the overall vehicle)
• ESD and EMC testing
• Sensor stimulation or sensor simulation for the VIL
• Case example from the automotive industry
• Levels of automated driving according to SAE
• Advanced driver assistance systems (ADAS) and autonomous driving (AD)
• Scenario-based validation of ADAS/AD
System Testing | Lecture/Practical (IL) | Coursecode: 200862309
Testing of Mechatronic Systems
4 SWS
4.5 ECTS
• Introduction to mechatronic systems of different complexity
• Functional relationship between the overall system and the subsystems involved
• Validation environments for mechatronic systems (MIL, SIL, HIL, test bench)
• Development and validation of models of subsystems
• Correlation between real-world tests and model-based tests
• Efficient allocation of the necessary validation tests to different test environments
• Methods for estimating test coverage
• Functional relationship between the overall system and the subsystems involved
• Validation environments for mechatronic systems (MIL, SIL, HIL, test bench)
• Development and validation of models of subsystems
• Correlation between real-world tests and model-based tests
• Efficient allocation of the necessary validation tests to different test environments
• Methods for estimating test coverage
4. Semester
Intercultural Communication and Meetings | Seminar (SE) | Coursecode: 200862401
Intercultural Communication and Meetings
2 SWS
3 ECTS
• Interpersonal communication and communication theory in intercultural context
• Preparing and carrying out international meetings
• Presentation preparation and presentation techniques
• Web meetings
• Effective communication with multicultural groups of people in different situations
• Preparing and carrying out international meetings
• Presentation preparation and presentation techniques
• Web meetings
• Effective communication with multicultural groups of people in different situations
Scientific Working | Master's Thesis (MA) | Coursecode: 200862403
Master's Thesis
1 SWS
24 ECTS
Solving a subject-specific engineering problem from the industrial environment The board examination is carried out in accordance with the requirements for final examinations of FH Master‘s degree programmes pursuant to FHStG as amended.
Scientific Working | Seminar (SE) | Coursecode: 200862402
Scientific Writing
1 SWS
3 ECTS
• Scientific methods and scientific community
• Literature search and quotation rules
• Structuring and writing scientific papers
• Planning of the necessary work steps as well as time and resource planning
• Scientific elaboration of a subject-specific task
• Presentation of interim and final result(s)
• Writing a scientific report in the form of a conference paper
• Literature search and quotation rules
• Structuring and writing scientific papers
• Planning of the necessary work steps as well as time and resource planning
• Scientific elaboration of a subject-specific task
• Presentation of interim and final result(s)
• Writing a scientific report in the form of a conference paper